Journal of Applied Research and Technology

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2008, 6 (1)

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AN AUTOMATIC TEST ENVIRONMENT FOR MICROELECTRONICS EDUCATION AND RESEARCH

Federico Sandoval-Ibarra.

Journal of Applied Research and Technology

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DIVERSE TIME-FREQUENCY DISTRIBUTIONS INTEGRATED TO AN ART2 NETWORK FOR NON-DESTRUCTIVE TESTING

H. Benítez-Pérez, L. Medina-Gómez.

Journal of Applied Research and Technology

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PATTERN CLASSIFICATION OF DECOMPOSED WAVELET INFORMATION USING ART2 NETWORKS FOR ECHOES ANALYSIS

M. Solís , H. Benítez-Pérez, E. Rubio , L. Medina-Gómez , E. Moreno , G. Gonzalez , L. Leija.

Journal of Applied Research and Technology

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MEASUREMENT OF CHUA CHAOS AND ITS APPLICATIONS

Ricardo Núñez Pérez.

Journal of Applied Research and Technology

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Ring CMOS NOT-based Oscillators: Analysis and Design

F. Sandoval-Ibarra, E. S. Hernández-Bernal.

Journal of Applied Research and Technology

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